Free Download Retroreflex Ellipsometry for Nonplanar Surfaces
Chia-Wei Chen
English | 2025 | ISBN: 9783731514022 | 208 Pages | True PDF | 10 MB
Retroreflex ellipsometry addresses the geometric restrictions of conventional ellipsometry by using a retroreflective sheet, which returns the light beam from the sample on the same beam path. Simulation and experiments of retroreflex ellipsometry in two- and three-phase systems have been demonstrated based on the proposed concepts, which have shown the capabilities of ellipsometric measurements on nonplanar surfaces.
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